On-line beam diagnostics based on single-shot beam splitting phase retrieval

作     者：何西 刘诚 朱健强 Xi He;Cheng Liu;and

作者机构：Shanghai Institute of Optics and Fine Mechanics Chinese Academy of Sciences Shanghai 201800 China University of Chinese Academy of Sciences Beijing 100049 China 

出 版 物：《Chinese Optics Letters》 (中国光学快报（英文版）)

年 卷 期：2018年第16卷第9期

页      面：39-45页

核心收录：

学科分类：0808[工学-电气工程] 0809[工学-电子科学与技术（可授工学、理学学位）] 08[工学] 0805[工学-材料科学与工程（可授工学、理学学位）] 0803[工学-光学工程] 0702[理学-物理学] 

基　　金：supported by the National Natural Science Foundation of China(No.61675215) the Shanghai Sailing Program(No.18YF1426600) 

主　　题：length On-line beam diagnostics based on single-shot beam splitting phase retrieval PIE 

摘      要：We propose a novel on-line beam diagnostic method based on single-shot beam splitting phase retrieval. The incident beam to be measured is diffracted into many replicas by a Dammann grating and then propagates through a weakly scattering phase plate with a known structure; the exiting beams propagate along their original direction and form an array of diffraction patterns on the detector plane. By applying the intensity of diffraction patterns into an iterative algorithm and calculating between the grating plane, weakly scattering plane, and detector plane, the complex field of the incident beam can be reconstructed rapidly; the feasibility of this method is verified experimentally with wavelengths of 1053 and 632.8 nm.