Correction of ultraviolet single photon counting image distortion

作     者：张兴华 赵宝升 缪震华 李伟 朱香平 刘永安 邹玮 

作者机构：State Key Laboratory of Transient Optics and PhotonicsXi'an Institute of Optics and Precision MechanicsChinese Acaderny of Sciences State Key Laboratory of Transient Optics and PhotonicsXi'an Institute of Optics and Precision MechanicsChinese Academy of Sciences 

出 版 物：《Chinese Optics Letters》 (中国光学快报（英文版）)

年 卷 期：2008年第6卷第9期

页      面：661-664页

核心收录：

学科分类：080901[工学-物理电子学] 0809[工学-电子科学与技术（可授工学、理学学位）] 08[工学] 080401[工学-精密仪器及机械] 0804[工学-仪器科学与技术] 0803[工学-光学工程] 

基　　金：supported by the Knowledge Innovation Program of Chinese Academy of Sciences 

主　　题：Image reconstruction Light measurement Nuclear physics Optoelectronic devices Particle beams Photons Visual communication 

摘      要：Single photon counting imaging technology has been widely used in space environment detection, astronomy observation, nuclear physics, and ultraweak bioluminescence. However, the distortion of the single photon counting image will badly affect the measurement results. Therefore, the correction of distortion for single photon counting image is very significant. Ultraviolet single photon imaging system with wedge and strip anode is introduced and the influence factor leading to image distortion is analyzed. To correct original distorted image, three different image correction methods, namely, the physical correction, the global correction, and the local correction, are applied. In addition, two parameters, i.e., the position index and the linearity index, are defined to evaluate the performance of the three methods. The results suggest that the correction methods can improve the quality of the initial image without losing gray information of each counting light spot. And the local correction can provide the best visual inspections and performance evaluation among the three methods.