A Novel Deflection Method for Measuring the Growth Stress of Thermally Growing Oxide Scales

作     者：Yuhai QIAN MeishuanShenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China 

作者机构：Lab. for Mat. Sci. Inst. of Metal Res. Chinese Acad. of Sci. Shenyang 110016 China 

出 版 物：《Journal of Materials Science & Technology》 (材料科学技术（英文版）)

年 卷 期：2003年第19卷第3期

页      面：231-234页

核心收录：

学科分类：07[理学] 070205[理学-凝聚态物理] 0702[理学-物理学] 

基　　金：the Special Funds for the Major State Basic Research Projects 

主　　题：Oxide film Growth stress Deflection method 

摘      要：A kind of new deflection technique has been developed for measuring the growth stress of thermally growing oxide scales during high temperature oxidation of alloys. The average growth stresses in oxide scales such as Al2O3, NiO and Cr2O3 formed on the surface of the superalloys can be investigated by this technique. Unlike the comventional deflection method, the novel method does not need to apply a coating for preventing one main face of thin strip specimen from oxidizing and can be used under the condition of longer time and higher temperature.