A recoverable stress testing algorithm for compression and encryption cards

作     者：Bao-jun ZHANG Xue-zeng PAN Jie-bing WANG Ling-di PING 

作者机构：Network and Security Lab School of Computer Science anc~Technology Zhejiang University Hangzhou 310027 China 

出 版 物：《Journal of Zhejiang University-Science A(Applied Physics & Engineering)》 (浙江大学学报（英文版）A辑（应用物理与工程）)

年 卷 期：2008年第9卷第10期

页      面：1398-1405页

核心收录：

学科分类：0810[工学-信息与通信工程] 08[工学] 0805[工学-材料科学与工程（可授工学、理学学位）] 0835[工学-软件工程] 0812[工学-计算机科学与技术（可授工学、理学学位）] 081202[工学-计算机软件与理论] 

基　　金：the Hi-Tech Research and Development Pro-gram (863) of China (No. 2006AA01Z431) the Giant Project of Zhejiang Province, China (No. 2006C11105) 

主　　题：Stress testing Random sequence Chaos function Synchronization Concurrency 

摘      要：This study proposes a recoverable stress testing algorithm （RSTA） for such special devices as compression/decompression card and encryption/deeryption card. It uses a chaos function to generate a random sequence, and then, according to the random sequence, generates an effective command sequence. The dispatch of command obeys a special schedule strategy we designed for such devices, i.e., the commands are sent according to the command sequence, and the complete commands are put in a buffer for further result check. RSTA is used to test the HIFN compression acceleration card SAICHI-1000. Test results show that RSTA can make the card work continuously and adequately.