Structure of Ag/Bi multilayers

作     者：Zhang, M Yu, W Liu, RP He, DW Wang, WK 

作者机构：Chinese Acad Sci Inst Phys Beijing 100080 Peoples R China Chinese Acad Sci Int Ctr Mat Phys Shenyang 110015 Peoples R China 

出 版 物：《Chinese Science Bulletin》 (科学通报(英文版))

年 卷 期：1997年第42卷第16期

页      面：1350-1353页

核心收录：

学科分类：08[工学] 080501[工学-材料物理与化学] 0805[工学-材料科学与工程（可授工学、理学学位）] 

主　　题：Ag/Bi multilayers interface. 

摘      要：MULTILAYERS are often formed from two elemental layers deposited alternately. In recent years, multilayer thin films have been used increasingly in both basic research and technological fields because of their specific properties in electricity, light, magnetism and mechanics as well as their high interfacial density. In many applications, one has to consider the effects arising from microstructure. If the thickness of sublayers is very small (several nanometers),multilayers may exhibit a dimensional periodic structure (modulation structure) in the