干扰元素加入法及其在电感耦合等离子体质谱法同位素分析中的应用

作     者：周国庆 朱凤蓉 李梅 俞江 董宏波 万可友 

作者机构：西北核技术研究所，陕西西安710024 

出 版 物：《质谱学报》 (Journal of Chinese Mass Spectrometry Society)

年 卷 期：2004年第25卷第B10期

页      面：185-186页

核心收录：

学科分类：081704[工学-应用化学] 07[理学] 08[工学] 0817[工学-化学工程与技术] 070302[理学-分析化学] 0703[理学-化学] 070301[理学-无机化学] 

主　　题：干扰元素 电感耦合等离子体质谱法 同位素丰度比 同质异位素 

摘      要：In this paper, Interferential Additions Calibration (IAC) which can be used to measure isotope abundance ratio by inductively coupled plasma-mass spectrometry (ICPMS) in the presence of isobaric interference was illustrated. In this method, it is only required that the isotope ratios of interferential element added to the sample must be the same as the analyte, and moreover, their accurate values must not be required. Compared with direct calibration, the IAC has more advantages in terms of practicability. Especially, the IAC can be used to remove the spectral interference caused by the tailing of strong peak or combined-ion. As an example, this method was be used to determine the abundance ratio of ^176Lu and ^175Lu in the presence of isobar Yb. The result met well with certificated value.