Modelling of particle layer detachment—Role of transient kinetic effects

作     者：Eberhard Schmidt 

作者机构：Faculty D-Safety Engineering/Environmental Protection University of WuppertalBuilding FFRainer-Gruenter-StrasseD-42119 WuppertalGermany 

出 版 物：《Particuology》 (颗粒学报（英文版）)

年 卷 期：2009年第7卷第1期

页      面：45-51页

核心收录：

学科分类：0809[工学-电子科学与技术（可授工学、理学学位）] 08[工学] 

基　　金：support by the German Science Foundation (DFG)in the project SCHM 810/27 is acknowledged 

主　　题：Adhesive forces Filter cleanability Dust cake discharge Patchy cleaning 

摘      要：Particle layers tend to build up on wails in many filtration and separation processes, calling for periodic removal in order to keep the apparatus running. Important factors are the adhesion of the layer on the substrate and the cohesion of the particles in the layer. Models describing such layer detachment generally assume constant and homogeneous conditions for the forces acting on the layer. But in reality detachment is extremely non-stationary concerning place and time, primarily due to changing conditions of the detaching forces on the one hand and changes in the particle layer morphology on the other. This paper describes a model and a simulation based on this model considering such transient kinetic effects, for which some computing results are presented and discussed.