Efficient Statistical Leakage Power Analysis Method for Function Blocks Considering All Process Variations

作     者：骆祖莹 

作者机构：College of Information Science and TechnologyBeijing Normal University 

出 版 物：《Tsinghua Science and Technology》 (清华大学学报（自然科学版（英文版）)

年 卷 期：2007年第12卷第S1期

页      面：67-72页

核心收录：

学科分类：080903[工学-微电子学与固体电子学] 0809[工学-电子科学与技术（可授工学、理学学位）] 08[工学] 

基　　金：the National Natural Science Foundation of China (No.60476014) 

主　　题：process variations statistical analysis leakage power very large scale integration (VLSI) 

摘      要：With technology scaling into nanometer regime, rampant process variations impact visible influences on leakage power estimation of very large scale integrations (VLSIs). In order to deal with the case of large inter- and intra-die variations, we induce a novel theory prototype of the statistical leakage power analysis (SLPA) for function blocks. Because inter-die variations can be pinned down into a small range but the number of gates in function blocks is large(1000), we continue to simplify the prototype. At last, we induce the efficient methodology of SLPA. The method can save much running time for SLPA in the low power design since it is of the local-updating advantage. A large number of experimental data show that the method only takes feasible running time (0.32 s) to obtain accurate results (3 σ-error 0.5% on maximum) as function block circuits simultaneous suffer from 7.5%(3 σ/mean) inter-die and 7.5% intra-die length variations, which demonstrates that our method is suitable for statistical leakage power analysis of VLSIs under rampant process variations.