Single order soft X-ray diffraction with quasi-random radius pinhole array spectroscopic photon sieves

作     者：张强强 魏来 杨祖华 钱凤 范全平 张博 谷渝秋 曹磊峰 Zhang Qiang-Qiang;Wei La;Yang Zu-Hua;Qian Feng;Fan Quan-Ping;Zhang Bo;Gu Yu-Qiu;Cao Lei-Feng;Research Center of Laser Fusion, China Academy of Engineering Physics

作者机构：Research Center of Laser Fusion China Academy of Engineering Physics 

出 版 物：《Chinese Physics B》 (中国物理B（英文版）)

年 卷 期：2014年第23卷第4期

页      面：342-346页

核心收录：

学科分类：070207[理学-光学] 07[理学] 0805[工学-材料科学与工程（可授工学、理学学位）] 0704[理学-天文学] 0702[理学-物理学] 

基　　金：Project supported by the National Key Scientific Instruments and Equipments Development of Special Item,China(Grant No.2012YQ130125) the National Natural Science Foundation of China(Grant No.11375160) 

主　　题：diffraction properties diffraction gratings soft X-rays single-order diffraction 

摘      要：A novel single order diffraction grating in the soft X-ray region, called quasi-random radius pinhole array spectro- scopic photon sieves （QRSPS）, is proposed in this paper. This new grating is composed of pinholes on a substrate, whose radii are quasi-random, while their centers are regular. Analysis proves that its transmittance function across the grating bar is similar to that of sinusoidal transmission gratings. Simulation results show that the QRSPS can suppress higher-order diffraction effectively. And the QRSPS would still retain its characteristic of single order diffraction when we take the effect of X-ray penetration into account. These properties indicate that the QRSPS can be used in the soft X-ray spectra measurement.