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Tracking code simulation for passive harmonic cavity in the SSRF storage ring

作     者:Thanapong Phimsen Bocheng Jiang Hongtao Hou Shunqiang Tian Manzhou Zhang Qinglei Zhang Kun Wang Zhentang Zhao 

作者机构:Shanghai Institute of Applied PhysicsChinese Academy of SciencesZhangjiang campusShanghai 201800China University of Chinese Academy of SciencesBeijing 100049China ShanghaiTech UniversityShanghai 201210China 

出 版 物:《Radiation Detection Technology and Methods》 (辐射探测技术与方法(英文))

年 卷 期:2018年第2卷第1期

页      面:57-64页

学科分类:08[工学] 082701[工学-核能科学与工程] 0827[工学-核科学与技术] 

基  金:The work is supported by the National Key Research and Development Program of China(2016YFA0402001) 

主  题:SSRF storage ring Transient beam loading 

摘      要:Background A passive third harmonic cavity is planned to install in the Shanghai Synchrotron Radiation Facility(SSRF)storage ring to increase the beam *** beam loading effect generated by the gap between the bunch trains can suppress the bunch lengthening effect of the third harmonic ***,the field excited in the passive operation of the harmonic cavity depends on the bunch *** To estimate the effect of transient beam loading,the tracking codes have been *** The tracking simulation has been performed for three uniform filling cases and a nonuniform filling *** lengthened bunch distribution has also been included into tracking code *** effect of the lengthened bunch has also been *** The uniform filling pattern with shorter bunch trains shows lower transient beam loading effect and can give much higher bunch lengthening factors compared to those of non-uniform filling *** effect caused by the reduction of the harmonic voltage generated by lengthened bunch distribution causes a great reduction on bunch lengthening effect in uniform filling case,while the lengthening factor of non-uniform filling case does not affect much in this *** The tracking codes have been developed to estimate the effect of transient beam loading for three uniform filling cases and a non-uniform filling *** larger gap in the filling pattern can cause the higher transient beam loading effect and lower bunch lengthening *** lengthened bunch distribution has also been included into tracking code *** effect of the lengthened bunch has also been *** more the bunch is lengthened,the greater reduction on bunch lengthening effect.

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