Vapor cell geometry effect on Rydberg atom-based microwave electric field measurement

作     者：Linjie Zhang Jiasheng Liu Yue Jia Hao Zhang Zhenfei Song Suotang Jia 张临杰;刘家晟;贾玥;张好;宋振飞;贾锁堂

作者机构：Institute of Laser SpectroscopyState Key Laboratory of Quantum Optics and Quantum Optics DevicesShanxi UniversityTaiyuan 030006China Collaborative Innovation Center of Extreme OpticsShanxi UniversityTaiyuan 030006China National Institute of MetrologyBeijing 100029China 

出 版 物：《Chinese Physics B》 (中国物理B（英文版）)

年 卷 期：2018年第27卷第3期

页      面：104-107页

核心收录：

学科分类：0809[工学-电子科学与技术（可授工学、理学学位）] 08[工学] 

基　　金：Project supported by the National Key Research and Development Program of China(Grant Nos.2017YFA03044200 and 2016YFF0200104) the National Natural Science Foundation of China(Grant Nos.91536110,61505099,and 61378013) the Fund for Shanxi“331 Project”Key Subjects Construction,China 

主　　题：Rydberg atom microwave electric field strength electromagnetically induced transparency (EIT) Aulter-Towns splitting 

摘      要：The geometry effect of a vapor cell on the metrology of a microwave electric field is investigated. Based on the splitting of the electromagnetically induced transparency spectra of cesium Rydberg atoms in a vapor cell, high-resolution spatial distribution of the microwave electric field strength is achieved for both a cubic cell and a cylinder cell. The spatial distribution of the microwave field strength in two dimensions is measured with sub-wavelength resolution. The experimental results show that the shape of a vapor cell has a significant influence on the abnormal spatial distribution because of the Fabry-P6rot effect inside a vapor cell. A theoretical simulation is obtained for different vapor cell wall thicknesses and shows that a restricted wall thickness results in a measurement fluctuation smaller than 3% at the center of the vapor cell.