Characterization of Birefringence and Dispersion Properties in an Arrayed Waveguide Grating
Characterization of Birefringence and Dispersion Properties in an Arrayed Waveguide Grating作者机构:Network Research Team Telecomm R&D Center Samsung Electronics Suwon KoreaNetwork Research Team Telecomm R&D Center Samsung Electronics Suwon KoreaNetwork Research Team Telecomm R&D Center Samsung Electronics Suwon KoreaNetwork Research Team Telecomm R&D Center Samsung Electronics Suwon KoreaDepartment of Electrical and Electronics Engineering SungKyunKwan University Suwon Korea
出 版 物:《光学学报》 (Acta Optica Sinica)
年 卷 期:2003年第23卷第S1期
页 面:293-294页
核心收录:
学科分类:070207[理学-光学] 07[理学] 08[工学] 0803[工学-光学工程] 0702[理学-物理学]
主 题:of as AWG Characterization of Birefringence and Dispersion Properties in an Arrayed Waveguide Grating PDL in
摘 要:We have characterized polarization dependent loss(PDL), differential group delay(DGD), and chromatic dispersion of an AWG and a simple method was proposed to estimate the chromatic dispersion from the measured DGD of the device.