Numerical calculation of multiple scattering with the layer model

作     者：Yuehuan Wei Jianqi Shen Haitao Yu 

作者机构：University of Shanghai for Science and Technology Shanghai 200093 China 

出 版 物：《Particuology》 (颗粒学报（英文版）)

年 卷 期：2009年第7卷第1期

页      面：76-82页

核心收录：

学科分类：080904[工学-电磁场与微波技术] 0809[工学-电子科学与技术（可授工学、理学学位）] 0817[工学-化学工程与技术] 081203[工学-计算机应用技术] 08[工学] 0805[工学-材料科学与工程（可授工学、理学学位）] 0703[理学-化学] 0835[工学-软件工程] 0702[理学-物理学] 0812[工学-计算机科学与技术（可授工学、理学学位）] 

基　　金：support from the National Natural Science Foundation of China (No. 50876069) the Ministry of Education of the People’s Republic of China (No.208041) from the Shanghai Municipal Education Commis-sion (No. 07ZZ88) 

主　　题：Multiple scattering Layer model Mie theory Forward scattering Particle analysis 

摘      要：The optical measurement technique based on Mie scattering has been applied to various areas, in which single scattering at low particle concentration is assumed. Nevertheless, since multiple scattering is usually unavoidable in online measurements, we present in this work a multiple scattering calculation method, in which a layer model is employed. The three-dimensional particle system is divided into a pile of layers the number of which is automatically determined, depending on the obscuration of the particle system. The calculation is found to be fast, reasonable and reliable.