Defect detection on button surfaces with the weighted least-squares model

作     者：Yu HAN Yubin WU Danhua CAO Peng YUN 

作者机构：School of Optical and Electronic Information Huazhong University of Science and Technology Wuhan 430074 China 

出 版 物：《Frontiers of Optoelectronics》 (光电子前沿（英文版）)

年 卷 期：2017年第10卷第2期

页      面：151-159页

核心收录：

学科分类：0809[工学-电子科学与技术（可授工学、理学学位）] 08[工学] 

主　　题：machine vision surface defect detection.weighted least-squares model 

摘      要：Defect detection assurance on production lines machine-vision-based surface is important in quality This paper presents a fast defect detection method using the weighted least-squares model. We assume that an inspection image can be regarded as a combination of a defect-free template image and a residual image. The defect-free template image is generated from training samples adaptively, and the residual image is the result of the subtraction between each inspection image and corresponding defect-free template image. In the weighted least-squares model, the residual error near the edge is suppressed to reduce the false alarms caused by spatial misalignment. Experiment results on different types of buttons show that the proposed method is robust to illumination vibration and rotation deviation and produces results that are better than those of two other methods.