Analytic fitting and simulation methods for characteristic X-ray peaks from Si-PIN detector
Analytic fitting and simulation methods for characteristic X-ray peaks from Si-PIN detector作者机构:Provincial Key Laboratory of Applied Nuclear Techniques in GeosciencesChengdu University of Technology State Key Laboratory of Geohazard Prevention and Geoenvironment ProtectionChengdu University of Technology Southwest University of Science and Technology
出 版 物:《Nuclear Science and Techniques》 (核技术(英文))
年 卷 期:2013年第24卷第6期
页 面:43-49页
核心收录:
学科分类:082704[工学-辐射防护及环境保护] 08[工学] 0827[工学-核科学与技术]
基 金:Supported by National Natural Science Foundation of China(Nos.40974065 and 41025015) Scientific and Technological Innovative Team in Sichuan Province(No.2011JTD0013) "863"Program of China(No.2012AA063501)
主 题:硅PIN探测器 最小二乘拟合 特征X射线 模拟方法 Si-PIN探测器 蒙特卡罗模型 响应函数 标准偏差
摘 要:A semi-empirical detector response function(DRF)model is established to fit characteristic X-ray peaks recorded in Si-PIN spectra,which is mainly composed of four components:a truncated step function,a Gaussian-shaped full-energy peak,a Gaussian-shaped Si escape peak and an exponential tail.A simple but useful statistical distribution-based analytic method(SDA)is proposed to achieve accurate values of standard deviation for characteristic X-ray *** the values of the model parameters except for the standard deviation are obtained by weighted least-squares fitting of the pulse-height spectra from a number of pure-element samples.A Monte Carlo model is also established to simulate the X-ray measurement *** simulated flux spectrum can be transformed by Si-PIN detector response function to real pulse height spectrum as studied in this ***,the fitting result for a copper alloy sample was compared with experimental spectra,and the validity of the present method was demonstrated.