Calculation of LET in SEE simulation by pulsed laser

作     者：HUANG Jianguo HAN Jianwei 

作者机构：Center for Space Science and Applied Research Chinese Academy of Sciences Beijing 100080 China Center for Space Science and Applied Research Chinese Academy of Sciences Beijing 100080 China 

出 版 物：《Science China(Physics,Mechanics & Astronomy)》 (中国科学：物理学、力学、天文学（英文版）)

年 卷 期：2005年第48卷第1期

页      面：113-121页

核心收录：

学科分类：07[理学] 08[工学] 

基　　金：This work was supported by the“10th Five-Year”Supporting Technology Program of the Chinese Academy of Sciences(Grant No.03422101020304) 

主　　题：SEE, pulsed laser, equivalent LET, device. 

摘      要：A key point in SEE (Single Event Effect) simulation experiment is how to calculate the equivalent LET (Linear Energy Transfer) for laser pulse. In this paper, the calculation method considering the influences of nonlinear absorption in semiconductor,reflection and refraction on device surface and other factors is presented. Simultaneously an instance of calculation is provided, with the result in good agreement with the SEU (Single Event Upset) threshold measured by heavy ions.