4 - 20 Additive Interaction of Hillock Formation on CaF2 Surface Irradiated by Highly Charged Xenon Ions in MeV Energy Regime
4 - 20 Additive Interaction of Hillock Formation on CaF2 Surface Irradiated by Highly Charged Xenon Ions in MeV Energy Regime作者机构：Cimap-Ganil Cea-Cnrs-Ensicaen-University of CAEN F-14070 Caen Cedex 5 France.
出 版 物：《IMP & HIRFL Annual Report》 (中国科学院近代物理研究所和兰州重离子研究装置年报（英文版）)
年 卷 期：2013年第1期
页 面：196-197页
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