Electron microscopy methods for space-, energy-, and time-resolved plasmonics

作     者：Arthur Losquin Tom T. A. Lummen 

作者机构：Department of Physics Lund University P.O. Box 118 SE-22100 Lund Sweden Laboratory for Ultrafast Microscopy and Electron Scattering ICMP Ecole Polytechnique Federale de Lausanne Station 6 CH-1015 Lausanne Switzerland 

出 版 物：《Frontiers of physics》 (物理学前沿（英文版）)

年 卷 期：2017年第12卷第1期

页      面：23-49页

核心收录：

学科分类：0810[工学-信息与通信工程] 081302[工学-建筑设计及其理论] 08[工学] 081001[工学-通信与信息系统] 0813[工学-建筑学] 

基　　金：supported by NanoLund, the Swedish Research Council (VR), and the Knut and Alice Wallenberg Foundation support from the Research Executive Agency (REA) through Marie Curie IEF 

主　　题：plasmonics electron microscopy Electron Energy Loss Spectroscopy (EELS) cathodoluminescence Photoemission Electron Microscopy (PEEM) Photo-Induced Near-field Electron Microscopy (PINEM) Electron Energy Gain Spectroscopy (EEGS) 

摘      要：Nanoscale plasmonic systems combine the advantages of optical frequencies with those of small spatial scales, circumventing the limitations of conventional photonic systems by exploiting the strong field confinement of surface plasmons. As a result of this miniaturization to the nanoscale, electron microscopy techniques are the natural investigative methods of choice. Recent years have seen the development of a number of electron microscopy techniques that combine the use of electrons and photons to enable unprecedented views of surface plasmons in terms of combined spatial, energy, and time resolution. This review aims to provide a comparative survey of these different approaches from an experimental viewpoint by outlining their respective experimental domains of suitability and highlighting their complementary strengths and limitations as applied to plasmonics in particular.