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GRAIN BOUNDARY SEGREGATION OF TRACE Sn IN A HIGH INDUCTION ORIENTED SILICON STEEL

GRAIN BOUNDARY SEGREGATION OF TRACE Sn IN A HIGH INDUCTION ORIENTED SILICON STEEL

作     者:ZHAO Yu HE Zhongzhi WENG Yuqing WU Baorong Central Iron and Steel Research Institute,Ministry of Metallurgical Industry,Beijing,China Doctorate Student,Department No.2,Central Iron and Steel Research Institute,Ministry of Metallurgical Industry,Beijing 100081,China 

出 版 物:《Acta Metallurgica Sinica(English Letters)》 (金属学报(英文版))

年 卷 期:1993年第6卷第1期

页      面:30-35页

核心收录:

学科分类:08[工学] 0805[工学-材料科学与工程(可授工学、理学学位)] 

主  题:silicon steel Sn segregation Auger secondary recrystallization 

摘      要:When Sn segregated at grain boundaries of high induction oriented silicon steel,no remarka- ble interaction between Sn and other elements was *** the starting temperature of secondary recrystallization,950℃,a certain Sn still segregates at grain *** seems to act as a supplemental inhibitor through grain boundary *** to theoreti- cal analysis,an addition of Sn may decrease the secondary recrystallization temperature of high induction oriented silicon steel,and it is in agreement with the experimental result.

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