Diagnosis of phasma in CCD damage process induced by laser
Diagnosis of phasma in CCD damage process induced by laser出 版 物：《Chinese Journal of Lasers》 (中国激光(英文版))
年 卷 期：1993年第5期
页 面：81-85页
主 题：CCD device MOS structure laser damage optical breakdown plasma
摘 要：In this paper, the shapes of plasma produced by a Q-switched YAG laser acted repeatedly upon a CCD with MOS structure are used, to investigate the destroying process of the optoelectronic device. The experimental results of CCD destroyed by a 1.06μm laser beam with a pulse width of 15 ns are given.
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