A Test Case Generation Approach Based on Sequence Diagram and Automata Models

作     者：ZHANG Chen DUAN Zhenhua YU Bin TIAN Cong DING Ming 

作者机构：Institute of Computing Theory and TechnologyXidian University School of Computer Science and TechnologyXidian University School of Information and TechnologyNorthwest University Xi’an Aeronautics Computing Technique Research InstituteAVIC 

出 版 物：《Chinese Journal of Electronics》 (电子学报(英文))

年 卷 期：2016年第25卷第2期

页      面：234-240页

核心收录：

学科分类：08[工学] 0835[工学-软件工程] 081202[工学-计算机软件与理论] 0812[工学-计算机科学与技术（可授工学、理学学位）] 

基　　金：supported by the National Natural Science Foundation of China(No.61420106004,No.61322202,No.61303031,No.61272117,No.61202177,No.61133001,No.61172147) the Fundamental Research Funds for the Central Universities(No.K5051303005) 

主　　题：Test model Model based testing Test scenario Test cases 

摘      要：To improve the test automation in software development process, following the researches on test cases generation technology from models, an incremental test case generation approach is proposed based on finite automata, and Event deterministic finite automata(ETDFA)are employed to describe the sequence diagram models of system interaction. By model checked with Propositional pro jection temporal logic(PPTL), the correctness of ETDFA is verified. Then we can get the composed automata by synthesis rules, and generate the test cases incrementally by test cases generation algorithm. Case studies are presented to show that this approach enables to improve test cases correctness, and reduce the complexity of test cases generation process.