ICTSSE: An Object-Oriented IC Test Software Supporting Environment

作     者：孙育宁 王晓明 时万春 

作者机构：InstituteofComputingTechnologyTheChineseAcademyofSciencesBeijing100080 

出 版 物：《Journal of Computer Science & Technology》 (计算机科学技术学报（英文版）)

年 卷 期：1995年第10卷第5期

页      面：447-454页

核心收录：

学科分类：080903[工学-微电子学与固体电子学] 0809[工学-电子科学与技术（可授工学、理学学位）] 08[工学] 0835[工学-软件工程] 081202[工学-计算机软件与理论] 0812[工学-计算机科学与技术（可授工学、理学学位）] 

基　　金：国家“九五”项目 

主　　题：CAT object-oriented paradigm data interchanging format 

摘      要：An IC test software supporting environment-ICTSSE, which supports the migration and simulation of test pattern programs on heterogeneous ATEs, is presented. ICTSSE is a subsystem of Test Developmellt System (TeDS). It has the capabilities of verifying the IC s stimulus/response vectors and associated timing resources against the target ATE. The general data interchange format,which is the center of the TeDS, is built for test pattern migration.