Sub-Wavelength Near-Field Metal Detection using an On-Chip Spintronic Technique

作     者：WANG Qi ZHU Xiao-Feng YUAN Xiao-Wen CHEN Chang-Qing LUO Xiang-Dong ZHANG Bo 王玘;朱晓峰;袁小文;陈长清;罗向东;张波

作者机构：Wuhan National Laboratory for OptoelectronicsHuazhong University of Science and TechnologyWuhan 430074 National Laboratory for Infrared PhysicsShanghai Institute of Technical PhysicsChinese Academy of SciencesShanghai 200083 

出 版 物：《Chinese Physics Letters》 (中国物理快报（英文版）)

年 卷 期：2013年第30卷第12期

页      面：183-185页

核心收录：

学科分类：0202[经济学-应用经济学] 02[经济学] 020205[经济学-产业经济学] 

基　　金：Supported by the National Natural Science Foundation of China under Grant Nos 11274330 and 10990103 

主　　题：microwave scattered field 

摘      要：A spintronic near-field microwave imaging system without vector network analyzers is used to detect the distribution of microwaves,which are scattered by a sub-wavelength periodical metal wire *** ultra thin metal body with diameter of 100μm(λ/300)is observed by imaging illuminated by a 10 GHz shining *** application with high sensitivity and resolution detection is proposed in the microwave region under a weak applied external static magnetic field.