MICROSTRUCTURE OF SILICON CARBIDE WHISKERS

作     者：XU Haigang ZHU Jing YUAN Hong Central Iron and Steel Research Institute,Ministry of Metallurgical Industry,Beijing,ChinaNING Xiaoguang YE Hengqiang Laboratory of Atomic Imaging of Solids,Institute of Metal Research,Academia Sinica,Shenyang,China 

作者机构：Central Iron and Steel Research Inst Beijing China 

出 版 物：《Acta Metallurgica Sinica(English Letters)》 (金属学报（英文版）)

年 卷 期：1991年第4卷第9期

页      面：211-218页

核心收录：

学科分类：0810[工学-信息与通信工程] 08[工学] 0805[工学-材料科学与工程（可授工学、理学学位）] 0812[工学-计算机科学与技术（可授工学、理学学位）] 

主　　题：SiC whisker microstructure defect 

摘      要：The morphology,crystal defects and chemical compositions of surfaces in two kinds of SiC whiskers related to their growth mechanism have been studied by means of electron microscopy and surface chemical *** upon the experimental results,five criteria for evaluating the whisker microstructure were suggested as:proportion of the perfect single crystals,morphology and dimensions,defects and their distribution,the bulk and surface chemistries,and crystallographic characteristics.