Combining electron microscopy with atomic-scale calculations——A personal perspective

作     者：Sokrates T.Pantelides 

作者机构：Department of Physics and Astronomy and Department of Electrical and Computer Engineering Vanderbilt University 

出 版 物：《Chinese Physics B》 (中国物理B)

年 卷 期：2024年第12期

页      面：14-24页

核心收录：

学科分类：08[工学] 080401[工学-精密仪器及机械] 0804[工学-仪器科学与技术] 0827[工学-核科学与技术] 082701[工学-核能科学与工程] 0803[工学-光学工程] 

摘      要：I had the privilege and the pleasure to work closely with Stephen J. Pennycook for about twenty years, having a group of post-docs and Vanderbilt-University graduate students embedded in his electron microscopy group at Oak Ridge National Laboratory, spending on average a day per week there. We combined atomic-resolution imaging of materials,electron-energy-loss spectroscopy, and density-functional-theory calculations to explore and elucidate diverse materials phenomena, often resolving long-standing issues. This paper is a personal perspective of that journey, highlighting a few examples to illustrate the power of combining theory and microscopy and closing with an assessment of future prospects.