Development of SPM Quantitative Micromorphology Analysis Software

作     者：Suozai Li Libing Liao(School of Materials Science and Engineering, China University of Geosciences, Beijing 100083, China) 

作者机构：School of Materials Science and Engineering China University of Geosciences Beijing 100083 China 

出 版 物：《International Journal of Minerals,Metallurgy and Materials》 (矿物冶金与材料学报（英文版）)

年 卷 期：1999年第13卷第2期

页      面：136-138页

核心收录：

学科分类：08[工学] 0835[工学-软件工程] 081202[工学-计算机软件与理论] 0812[工学-计算机科学与技术（可授工学、理学学位）] 

主　　题：SPM quantitative micromorphology analysis software 

摘      要：Scanning Probe Microscope (SPM) has great advantages in quantitative micromorphology analysis because of its conveniencein obtaining micromorphology information of materials on nanometer or atomic scale under control of a computer. Based on an established SPM quantitative micromorphology analysis model, an SPM image analysis software Which can calculate both two- and three-dimensional micromorphology parameters is developed.