Cable coupling response in metal cavity under X-ray irradiation

作     者：Zhang, Mao-Xing Yuan, Lan-Feng Meng, Cui Liu, Yi-Nong 

作者机构：Tsinghua Univ Dept Engn Phys Beijing 100084 Peoples R China Minist Educ Lab Particle & Radiat Imaging Beijing 100084 Peoples R China Zhejiang Univ Coll Elect Engn Hangzhou 310007 Peoples R China 

出 版 物：《NUCLEAR SCIENCE AND TECHNIQUES》 (核技术（英文）)

年 卷 期：2024年第35卷第10期

页      面：1-11页

核心收录：

学科分类：07[理学] 0827[工学-核科学与技术] 070202[理学-粒子物理与原子核物理] 0702[理学-物理学] 

主　　题：Ionizing radiation Metal cavity System-generated electromagnetic pulse Transmission-line model SIMULATION CODE EQUATIONS IEMP 

摘      要：This study investigates the coupling response of cables inside a metal cavity under X-ray irradiation using the finite-difference time-domain method, particle simulation method, and transmission-line equation to solve the electromagnetic field inside the cavity and load voltage at the cable terminal under X-ray excitation. The results show that under a strong ionizing radiation environment of 1J/cm2\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${1}\,{\hbox {J/cm}{2}}$$\end{document}, a strong electromagnetic environment is generated inside the cavity. The cable shielding layer terminal couples a voltage of 15.32 V, whereas the core wire terminal couples a voltage of 0.31 V. Under strong X-ray irradiation, the metal cavity not only fails to provide electromagnetic shielding, but also introduces new electromagnetic interference. This study also provides a method for reducing the number of emitted electrons by adding low-Z materials, which can effectively reduce the coupled electric field and voltage.