Visualizing extended defects at the atomic level in a Bi_(2)Sr_(2)CaCu_(2)O8_(+σ) superconducting wire

作     者：Kejun Hu Shuai Wang Boyu Li Ying Liu Binghui Ge Dongsheng Song 胡柯钧;王帅;李泊玉;刘影;葛炳辉;宋东升

作者机构：Information Materials and Intelligent Sensing Laboratory of Anhui ProvinceKey Laboratory of Structure and Functional Regulation of Hybrid Materials of Ministry of EducationInstitutes of Physical Science and Information TechnologyAnhui UniversityHefei 230601China 

出 版 物：《Chinese Physics B》 (中国物理B（英文版）)

年 卷 期：2024年第33卷第9期

页      面：43-47页

核心收录：

学科分类：080705[工学-制冷及低温工程] 07[理学] 070205[理学-凝聚态物理] 08[工学] 0807[工学-动力工程及工程热物理] 0702[理学-物理学] 

主　　题：superconductor microstructure defect scanning transmission electron microscopy 

摘      要：The microstructure significantly influences the superconducting ***,the defect structures and atomic arrangements in high-temperature Bi_(2)Sr_(2)CaCu_(2)O8_(+σ) superconducting wire are directly characterized via stateof-the-art scanning transmission electron *** oxygen atoms are observed in both the charge reservoir layers and grain boundaries in the doped *** phases with varied numbers of CuO_(2) layers are found,and twist interfaces with different angles are *** study provides insights into the structures of Bi-2212 wire and lays the groundwork for guiding the design of microstructures and optimizing the production methods to enhance superconducting performance.