Micron-sized fiber diamond probe for quantum precision measurement of microwave magnetic field

作     者：卢文韬 夏圣开 陈爱庆 何康浩 许增博 陈艺涵 汪洋 葛仕宇 安思瀚 吴建飞 马艺菡 杜关祥 Wen-Tao Lu;Sheng-Kai Xia;Ai-Qing Chen;Kang-Hao He;Zeng-Bo Xu;Yi-Han Chen;Yang Wang;Shi-Yu Ge;Si-Han An;Jian-Fei Wu;Yi-Han Ma;Guan-Xiang Du

作者机构：Portland InstituteNanjing University of Posts and TelecommunicationsNanjing 210023China School of Computer ScienceNanjing University of Posts and TelecommunicationsNanjing 210023China College of Telecommunication and Information EngineeringNanjing University of Posts and TelecommunicationsNanjing 210003China School of EconomicsNanjing University of Posts and TelecommunicationsNanjing 210023China School of Electronic and Optical EngineeringNanjing University of Posts and TelecommunicationsNanjing 210023China School of ScienceNanjing University of Posts and TelecommunicationsNanjing 210023China College of Electronic Science and TechnologyNational University of Defense TechnologyChangsha 410000China 

出 版 物：《Chinese Physics B》 (中国物理B（英文版）)

年 卷 期：2024年第33卷第8期

页      面：186-190页

核心收录：

学科分类：0809[工学-电子科学与技术（可授工学、理学学位）] 08[工学] 

基　　金：Project supported by the National Key Research and Development Program of China (Grant No.2021YFB2012600) 

主　　题：quantum precision measurement electromagnetic field diamond NV center quantum metrology 

摘      要：We present a quantitative measurement of the horizontal component of the microwave magnetic field of a coplanar waveguide using a quantum diamond probe in fiber *** measurement results are compared in detail with simulation,showing a good *** simulation shows fiber diamond probe brings negligible disturbance to the field under measurement compared to bulk *** method will find important applications ranging from electromagnetic compatibility test and failure analysis of high frequency and high complexity integrated circuits.