Effect of multiple coulomb scattering on the beam tests of silicon pixel detectors

作     者：Lan-Kun Li Ming-Yi Dong Ze Gao Liang-Cheng-Long Jin Shu-Jun Zhao Lan-Kun Li;Ming-Yi Dong;Ze Gao;Liang-Cheng-Long Jin;Shu-Jun Zhao

作者机构：School of Physics and MicroelectronicsZhengzhou UniversityZhengzhou 450001China State Key Laboratory of Particle Detection and Electronics(Institute of High Energy PhysicsCAS)Beijing 100049China University of Chinese Academy of ScienceBeijing 100049China University of South ChinaHengyang 421001China 

出 版 物：《Nuclear Science and Techniques》 (核技术（英文）)

年 卷 期：2024年第35卷第4期

页      面：200-207页

核心收录：

学科分类：082704[工学-辐射防护及环境保护] 08[工学] 0827[工学-核科学与技术] 

基　　金：supported by the National Natural Science Foundation of China(Nos.11875274 and U1232202) 

主　　题：Silicon Pixel Detectors Beam Telescope Multiple Coulomb Scattering Spatial Resolution 

摘      要：In the research and development of new silicon pixel detectors,a collimated monoenergetic charged-particle test beam equipped with a high-resolution pixel-beam telescope is crucial for prototype verification and performance *** the beam energy is low,the effect of multiple Coulomb scattering on the measured resolution of the Device Under Test(DUT)must be considered to accurately evaluate the performance of the pixel chips and *** study aimed to investigate the effect of multiple Coulomb scattering on the measured resolution,particularly at low beam *** were conducted using Allpix^(2) to study the effects of multiple Coulomb scattering under different beam energies,material budgets,and telescope *** simulations also provided the minimum energy at which the effect of multiple Coulomb scattering could be *** with the results of a five-layer detector system tested with an electron beam at DESY,the simulation results were consistent with the beam test results,confirming the reliability of the simulations.