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A polarizing situation: Taking an in-plane perspective for next-generation near-field studies

A polarizing situation: Taking an in-plane perspective for next-generation near-field studies

作     者:P. James Schuck Wel Bao Nicholas J. Borys 

作者机构:Molecular Foundry Lawrence Berkeley National Laboratory Berkeley CA 94720 USA Department of Materials Science and Engineering University of California Berkeley CA 94720-1760 USA 

出 版 物:《Frontiers of physics》 (物理学前沿(英文版))

年 卷 期:2016年第11卷第2期

页      面:1-17页

核心收录:

学科分类:080904[工学-电磁场与微波技术] 07[理学] 0809[工学-电子科学与技术(可授工学、理学学位)] 08[工学] 0810[工学-信息与通信工程] 070207[理学-光学] 081105[工学-导航、制导与控制] 081001[工学-通信与信息系统] 0803[工学-光学工程] 081002[工学-信号与信息处理] 0825[工学-航空宇航科学与技术] 0811[工学-控制科学与工程] 0702[理学-物理学] 

基  金:supported by the Director  Office of Science  Office of Basic Energy Sciences  Division of Materials Sciences and Engineering  of the U.S. Department of Energy 

主  题:near-field optical microscopy nano-optics TERS plasmonics optical antenna 2D materials 

摘      要:By enabling the probing of light-matter interactions at the functionally relevant length scales of most materials, near-field optical imaging and spectroscopy accesses information that is unobtainable with other methods. The advent of apertureless techniques, which exploit the ultralocalized and enhanced near-fields created by sharp metallic tips or plasmonic nanoparticles, has resulted in rapid adoption of near-field approaches for studying novel materials and phenomena, with spatial resolution approaching sub-molecular levels. However, these approaches are generally limited by the dominant out-of-plane polarization response of apertureless tips, restricting the exploration and discovery of many material properties. This has led to recent design and fabrication breakthroughs in near-field tips engineered specifically for enhancing in-plane interactions with near-field light components. This mini-review provides a perspective on recent progress and emerging directions aimed at utilizing and controlling in-plane optical polarization, highlighting key application spaces where in-plane near-field tip responses have enabled recent advancements in the understanding and development of new nanostructured materials and devices.

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