A new analytical edge spread function fitting model for modulation transfer function measurement
A new analytical edge spread function fitting model for modulation transfer function measurement作者机构:State Key Laboratory of Modern Optical InstrumentationZhejiang University
出 版 物:《Chinese Optics Letters》 (中国光学快报(英文版))
年 卷 期:2011年第9卷第3期
页 面:37-40页
核心收录:
学科分类:0808[工学-电气工程] 07[理学] 0809[工学-电子科学与技术(可授工学、理学学位)] 0805[工学-材料科学与工程(可授工学、理学学位)] 0701[理学-数学] 0702[理学-物理学]
基 金:supported by the National Natural Science Foundation of China (No.60977010) the National Key Basic Research and Development Program of China (No.2009CB724006) the National High Technology Research and Development Program of China (No.2009AA12Z108) the Innovation Foundation of China Aerospace Science and Technology Corporation
主 题:Fourier transforms Image reconstruction Least squares approximations Optical transfer function
摘 要:We propose a new analytical edge spread function (ESF) fitting model to measure the modulation transfer function (MTF).The ESF data obtained from a slanted-edge image are fitted to our model through the non-linear least squares (NLLSQ) method.The differentiation of the ESF yields the line spread function (LSF),the Fourier transform of which gives the profile of two-dimensional MTF.Compared with the previous methods,the MTF estimate determined by our method conforms more closely to the reference.A practical application of our MTF measurement in degraded image restoration also validates the accuracy of our model.