Separating Overlapped Peaks of SF6 Decomposed Products Based on Iterative Curve-fitting Method

作     者：ZHANG Xiao-xing XIE Yan-bin YAO Yao TANG Ju REN Jiang-bo ZHANG Xiao-xing;XIE Yan-bin;YAO Yao

作者机构：State Key Laboratory of Power Transmission Equipment & System Security and New Technology Chongqing University Chongqing 400044 China 

出 版 物：《高电压技术》 (High Voltage Engineering)

年 卷 期：2008年第34卷第12期

页      面：2708-2712页

核心收录：

学科分类：0808[工学-电气工程] 0809[工学-电子科学与技术（可授工学、理学学位）] 080803[工学-高电压与绝缘技术] 08[工学] 0807[工学-动力工程及工程热物理] 

基　　金：Project Supported by National Natural Science Foundation of China ( 50777070)  Science and Technique Project of Chongqing (CSTC  2007AC2041 ) 

主　　题：曲线拟合法 SF6分解组分 重叠色谱峰 分离 高斯函数 

摘      要：The SF6 decomposed products are very alike,so the peaks of the SF6 decomposed products are *** make us hard to quantitatively *** paper introduced a method to separate the overlapped chromatogram peaks with iterative curve-fitting and Gauss function,and deduced the formula of the iterative curve-fitting;provided a method to calculate the initial value of the peaks intensity and width by iterative formula,and confirm the final peaks intensity and width to separate the overlapped *** the analysis of the real chromatogram data,it proved the validity of this method on the main components used in distinguishing the GIS internal *** method overcomes the influence of SF6 peak to the other thin concentration peaks,so it can be used in the study of the quantitative analysis of the decomposed products on different failures and different voltages.