Edge Device Fault Probability Based Intelligent Calculations for Fault Probability of Smart Systems
作者机构：School of Environmental and Chemical EngineeringShenyang Ligong UniversityShenyang 110159China Chulalongkorn Business SchoolFaculty of Commerce and AccountancyChulalongkorn UniversityBangkok 10900Thailand
出 版 物：《Tsinghua Science and Technology》 (清华大学学报自然科学版（英文版）)
年 卷 期：2024年第29卷第4期
页 面：1023-1036页
核心收录：
学科分类：0808[工学-电气工程] 070801[理学-固体地球物理学] 07[理学] 0708[理学-地球物理学] 0835[工学-软件工程] 0812[工学-计算机科学与技术（可授工学、理学学位）]
基 金：supported by the National Natural Science Foundation of China(No.52004120)
主 题：smart systems intelligent science edge device fault probability decision method
摘 要：In a smart system, the faults of edge devices directly impact the system’s overall fault. Further, complexity arises when different edge devices provide varying fault data. To study the Smart System Fault Evolution Process (SSFEP) under different fault data conditions, an intelligent method for determining the Smart System Fault Probability (SSFP) is proposed. The data types provided by edge devices include the following: (1) only known edge device fault probability;(2) known Edge Device Fault Probability Distribution (EDFPD);(3) known edge device fault number and EDFPD;(4) known factor state of the edge device fault and EDFPD. Moreover, decision methods are proposed for each data case. Transfer Probability (TP) is divided into Continuity Transfer Probability (CTP) and Filterability Transfer Probability (FTP). CTP asserts that a Cause Event (CE) must lead to a Result Event (RE), while FTP requires CF probability to exceed a threshold before RF occurs. These probabilities are used to calculate SSFP. This paper introduces a decision method using the information diffusion principle for low-data SSFP determination, along with an improved method. The method is based on space fault network theory, abstracting SSFEP into a System Fault Evolution Process (SFEP) for research purposes.
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