Graph-Based Feature Learning for Cross-Project Software Defect Prediction
作者机构:School of SoftwareNorthwestern Polytechnical UniversityXi’anChina School of Computer ScienceNorthwestern Polytechnical UniversityXi’anChina Department of Computer ScienceHodeidah UniversityPO Box 3114Al-HudaydahYemen Research Institute of Engineering and TechnologyHanyang UniversityAnsanKorea Department of RoboticsHanyang UniversityAnsanKorea
出 版 物:《Computers, Materials & Continua》 (计算机、材料和连续体(英文))
年 卷 期:2023年第77卷第10期
页 面:161-180页
核心收录:
学科分类:08[工学] 0835[工学-软件工程] 081202[工学-计算机软件与理论] 0812[工学-计算机科学与技术(可授工学、理学学位)]
主 题:Cross-project defect prediction graphs features deep learning graph embedding
摘 要:Cross-project software defect prediction(CPDP)aims to enhance defect prediction in target projects with limited or no historical data by leveraging information from related source *** existing CPDP approaches rely on static metrics or dynamic syntactic features,which have shown limited effectiveness in CPDP due to their inability to capture higher-level system properties,such as complex design patterns,relationships between multiple functions,and dependencies in different software projects,that are important for *** paper introduces a novel approach,a graph-based feature learning model for CPDP(GB-CPDP),that utilizes NetworkX to extract features and learn representations of program entities from control flow graphs(CFGs)and data dependency graphs(DDGs).These graphs capture the structural and data dependencies within the source *** proposed approach employs Node2Vec to transform CFGs and DDGs into numerical vectors and leverages Long Short-Term Memory(LSTM)networks to learn predictive *** process involves graph construction,feature learning through graph embedding and LSTM,and defect *** evaluation using nine open-source Java projects from the PROMISE dataset demonstrates that GB-CPDP outperforms state-of-the-art CPDP methods in terms of F1-measure and Area Under the Curve(AUC).The results showcase the effectiveness of GB-CPDP in improving the performance of cross-project defect prediction.