Improved Data Compression Scheme for Multi-Scan Designs

作     者：林腾 冯建华 王阳元 

作者机构：Department of MicroelectronicsPeking University 

出 版 物：《Tsinghua Science and Technology》 (清华大学学报（自然科学版（英文版）)

年 卷 期：2007年第12卷第S1期

页      面：89-94页

核心收录：

学科分类：080903[工学-微电子学与固体电子学] 0809[工学-电子科学与技术（可授工学、理学学位）] 08[工学] 

基　　金：the National Natural Science Foundation of China (Nos. 90207018 and 60576030) 

主　　题：test data compression multi-scan design test data volume 

摘      要：This paper presents an improved test data compression scheme based on a combination of test data compatibility and dictionary for multi-scan designs to reduce test data volume and thus test cost. The proposed method includes two steps. First a drive bit matrix with less columns is generated by the compatibilities between the columns of the initial scan bit matrix, also the inverse compatibilities and the logic dependencies between the columns of mid bit matrixes. Secondly a dictionary bit matrix with limited rows is constructed, which has the properties that for each row of the drive bit matrix, a compatible row exists or can be generated by XOR operation of multiple rows in the dictionary bit matrix and the total number of rows used to compute all compatible rows is minimal. The rows in the dictionary matrix are encoded to further reduce the number of ATE channels and test data volume. Experimental results for the large ISCAS 89 benchmarks show that the proposed method significantly reduces test data volume for multi-scan designs.