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Annealing atmosphere-dependent capacitive energy storage

作     者:Bing-Bing Yang Hai-Yun Tong Shun Lan Yi-Qian Liu Lv-Ye Dou Hao Pan Yuan-Hua Lin Bing-Bing Yang;Hai-Yun Tong;Shun Lan;Yi-Qian Liu;Lv-Ye Dou;Hao Pan;Yuan-Hua Lin

作者机构:State Key Laboratory of New Ceramics and Fine ProcessingSchool of Materials Science and EngineeringTsinghua UniversityBeijing100084China School of Physics and Materials EngineeringHefei Normal UniversityHefei230601China Department of Materials Science and EngineeringUniversity of CaliforniaBerkeley94720USA 

出 版 物:《Rare Metals》 (稀有金属(英文版))

年 卷 期:2023年第42卷第5期

页      面:1465-1471页

核心收录:

学科分类:080801[工学-电机与电器] 0808[工学-电气工程] 08[工学] 0805[工学-材料科学与工程(可授工学、理学学位)] 

基  金:financially supported by the National Key Research Program of China (No.2021YFB3800601) the Basic Science Center Project of the National Natural Science Foundation of China (NSFC,No.51788104)。 

主  题:Aurivillius phase film Annealing atmosphere Energy density Efficiency 

摘      要:Electrostatic capacitors based on dielectrics with high energy density and efficiency are desired for modern electrical systems owing to their intrinsic fast charging-discharging speed and excellent reliability.The longstanding bottleneck is their relatively small energy density.Herein,we report enhanced energy density and efficiency in the Aurivillius Pb_(2)Bi_(4)Ti_(5)O_(18)films by controlling the post-annealing atmosphere.The results demonstrate that the fabrication atmosphere has significant effects on the film texture and defects.As the increase of the oxygen pressure of annealing atmosphere,the Pb_(2)Bi_(4)Ti_(5)O_(18)films show a preferred growth orientation of(00l)and fewer defects,which leads to a higher polarization and breakdown field for the film annealed in air atmosphere and thus help to achieve an ultrahigh energy density of59.4 J·cm^(-3)and an improved efficiency of 81.2%.Moreover,the film also exhibits excellent cycling reliability and good thermal stability.The Pb_(2)Bi_(4)Ti_(5)O_(18)films show a significant potential application for dielectric capacitors.

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