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文献详情 >Direct high-resolution X-ray i... 收藏

Direct high-resolution X-ray imaging exploiting pseudorandomness

作     者:KyeoReh Lee Jun Lim Su Yong Lee YongKeun Park KyeoReh Lee;Jun Lim;Su Yong Lee;YongKeun Park

作者机构:Department of PhysicsKorea Advanced Institute of Science and TechnologyDaejeon 34141Republic of Korea KAIST Institute for Health Science and TechnologyKorea Advanced Institute of Science and TechnologyDaejeon 34141Republic of Korea Pohang Accelerator LaboratoryPohang University of Science and TechnologyPohangKyungbuk 37637Republic of Korea Tomocube IncDaejeon 34051Republic of Korea 

出 版 物:《Light(Science & Applications)》 (光(科学与应用)(英文版))

年 卷 期:2023年第12卷第5期

页      面:776-788页

核心收录:

学科分类:070207[理学-光学] 07[理学] 08[工学] 0803[工学-光学工程] 0702[理学-物理学] 

基  金:supported by the Tomocube,KAIST Advanced Institute for Science-X,National Research Foundation of Korea(2015R1A3A2066550,2021R1C1C2009220,2022M3H4A1A02074314) an Institute of Information&Communications Technology Planning&Evaluation(IITP)grant funded by the Korean government(MSIT)(2021-0-00745) Technology Innovation program(20011661)funded by the Ministry of Trade,Industry&Energy(MOTIE) supported in part by MSIT and POSTECH 

主  题:resolution speckle replace 

摘      要:Owing to its unique penetrating power and high-resolution capability,X-ray imaging has been an irreplaceable tool since its *** the significance,the resolution of X-ray imaging has largely been limited by the technical difficulties on X-ray lens *** lensless imaging methods have been proposed,but are yet relying on multiple measurements or additional constraints on measurements or *** we present coherent specklecorrelation imaging(CSI)using a designed X-ray *** has no prerequisites for samples or ***,from a single shot measurement,the complex sample field is retrieved based on the pseudorandomness of the speckle intensity pattern,ensured through a *** achieve a spatial resolution of 13.9 nm at 5.46 keV,beating the feature size of the diffuser used(300 nm).The high-resolution imaging capability is theoretically explained based on fundamental and practical *** expect the CSI to be a versatile tool for navigating the unexplored world of nanometer.

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