The Immunity of Evolvable Digital Circuits to ESD Interference

作     者：Shanghe Liu Menghua Man Zhengquan Ju Xiaolong Chang Jie Chu Liang Yuan 

作者机构：Electrostatic and Electromagnetic Protection Institute Mechanical Engineering College Shijiazhuang 050003 P. R. China Computer Engineering Department Mechanical Engineering College Shijiazhuang 050003 P. R. China 

出 版 物：《Journal of Bionic Engineering》 (仿生工程学报（英文版）)

年 卷 期：2012年第9卷第3期

页      面：358-366页

核心收录：

学科分类：090502[农学-动物营养与饲料科学] 080902[工学-电路与系统] 0809[工学-电子科学与技术（可授工学、理学学位）] 08[工学] 0905[农学-畜牧学] 09[农学] 

基　　金：Acknowledgments This work was supported by the National Natural Science Foundation of China (Grant no. 61172035) 

主　　题：biomimetics electrostatic interference immunity evolvable digital circuits 

摘      要：With the rapid development of semiconductor technology and the increasing proliferation of emission sources, digital circuits are frequently used in harsh and hostile electromagnetic environments. Electrostatic Discharge （ESD） interferences are gradually gaining prominence, resulting in performance degradations, malfunctions and disturbances in component and/or system level applications. Conventional solutions to such problems are shielding, filtering and grounding. This paper proposes a novel Evolvable Digital Circuit （EDC） for intrinsic immunity. The key idea is motivated by the noise-robustness and fault-tolerance of the biological system. First, the architecture of the EDC is designed based on the cell structure. Then, ESD immunity tests are carried out on the most fragile element of the EDC in operation. Based on the results, fault models are also presented to simulate different functional disturbances. Finally, the immunity of the EDC is evaluated while it is exposed to a variety of simulated environments. The results which demonstrate a graceful immunity to ESD interference are presented.