Optical wavelength meter with machine learning enhanced precision

作     者：GAZI MAHAMUD HASAN MEHEDI HASAN PENG LIU MOHAMMAD RAD ERIC BERNIER TREVOR JAMES HALL 

作者机构：Photonic Technology LaboratoryAdvanced Research ComplexUniversity of OttawaK1N 6N5 OntarioCanada Huawei Technologies CanadaKanataK2K 3J1 OntarioCanada 

出 版 物：《Photonics Research》 (光子学研究（英文版）)

年 卷 期：2023年第11卷第3期

页      面：420-430页

核心收录：

学科分类：12[管理学] 1201[管理学-管理科学与工程(可授管理学、工学学位)] 070207[理学-光学] 07[理学] 081104[工学-模式识别与智能系统] 08[工学] 0835[工学-软件工程] 0803[工学-光学工程] 0811[工学-控制科学与工程] 0812[工学-计算机科学与技术（可授工学、理学学位）] 0702[理学-物理学] 

基　　金：Huawei Technologies Canada Ontario Student Assistance Program University of Ottawa, UO 

主　　题：delay circular invariant 

摘      要：A photonic implementation of a wavelength meter typically applies an interferometer to measure the frequencydependent phase shift provided by an optical delay *** work shows that the information to be retrieved is encoded by a vector restricted to a circular cone within a 3D Cartesian object *** measured data belong to the image of the object space under a linear orthogonal *** impairments result in broken orthogonal symmetry,but the mapping remains *** circular cone is retained as the object space,which suggests that the conventional conic section fitting for the wavelength meter application is a premature reduction of the object space from R^(3)to R^(2).The inverse map,constructed by a learning algorithm,compensates impairments such as source intensity fluctuation and errors in delay time,coupler transmission,and photoreceiver sensitivity while being robust to *** simple algorithm does not require initial estimates for all parameters except for a broad bracket of the delay;further,weak nonlinearity introduced by uncertain delay can be corrected by a robust golden search *** phase-retrieval process is invariant to source power and its *** demonstrate that,to the extent that the ten parameters of the interferometer model capture all significant impairments,a precision limited only by the level of random noise is *** to measured data collected from a fabricated Si_(3)N_(4)wavelength meter,greater than an order of magnitude improvement in precision compared with the conventional method is achieved.