Genetic Dissection of Quantitative Trait Loci for Panicle Traits and Heat Tolerance by High-Density Bin Map in Rice

作     者：LIU Hongyan MA Xiaosong LI Enxi ZENG Xianjun LUO Lijun LIU Hongyan;MA Xiaosong;LI Enxi;ZENG Xianjun;LUO Lijun

作者机构：Shanghai Agrobiological Gene CenterShanghai 201106China Key Laboratory of Grain Crop Genetic Resources Evaluation and UtilizationMinistry of Agriculture and Rural AffairsShanghai 201106China Hainan UniversityHaikou 570228China Huazhong Agricultural UniversityWuhan 430070China 

出 版 物：《Rice science》 (水稻科学（英文版）)

年 卷 期：2022年第29卷第6期

页      面：507-511,I0007-I0020页

核心收录：

学科分类：0710[理学-生物学] 09[农学] 0901[农学-作物学] 

基　　金：supported by the Natural Science Foundation of Shanghai, China (Grant Nos. 18ZR1433500 and 19ZR1446700) Runup Talent Project of Shanghai Academy of Agricultural Sciences Program, China (Grant No. ZP21231) 

主　　题：panicle Traits Map 

摘      要：A recombinant inbred line(RIL)with 179 lines derived from a cross between a heat tolerant line Huhan 1B and a heat sensitive line Hanhui 3 was used for QTL mapping for panicle traits and heat tolerance.A total of 52 QTLs were identified with LOD scores from 3.85 to 54.93,each explaining 0.70%to 21.48%of the phenotypic variances,including 11 for panicle length(PL),11 for seed number per panicle(SN),14 for spikelet number per panicle(SNPP),6 for seed-setting rate(SSR)under normal conditions,and 5 for seed-setting rate(SSR_HT)and 5 for relative seed-setting rate(RSSR)under heat stress,respectively.