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4^(th) generation synchrotron source boosts crystalline imaging at the nanoscale

作     者:Peng Li Marc Allain Tilman A.Grunewald Marcus Rommel Andrea Campos Dina Carbone Virginie Chamard Peng Li;Marc Allain;Tilman A.Grünewald;Marcus Rommel;Andrea Campos;Dina Carbone;Virginie Chamard

作者机构:Aix-Marseille UnivCNRSCentrale MarseilleInstitut FresnelMarseilleFrance Nanofabrication LaboratoryDepartment of Microtechnology and NanoscienceMC2Chalmers University of TechnologySE-41296 GothenburgSweden Aix Marseille UnivCNRSCentrale MarseilleFSCM(FR1739)CP2M13397 MarseilleFrance. MAX IV LaboratoryFotongatan 222594 LundSweden Present address:Diamond Light SourceHarwell Science and Innovation CampusFermi AveDidcot OX110DEUK 

出 版 物:《Light(Science & Applications)》 (光(科学与应用)(英文版))

年 卷 期:2022年第11卷第4期

页      面:662-673页

核心收录:

学科分类:070207[理学-光学] 07[理学] 0805[工学-材料科学与工程(可授工学、理学学位)] 0703[理学-化学] 0702[理学-物理学] 

基  金:the European Research Council(European Union’s Horizon H2020 research and innovation program grant agreements No 724881 Research conducted at MAX IV is supported by the Swedish Research Council under Contract 2018-07152 the Swedish Governmental Agency for Innovation Systems under Contract 2018-04969,and Formas under Contraa 2019-02496. 

主  题:crystalline coherent source 

摘      要:New 4^(th)-generation synchrotron sources,with their increased bilince,promise to greatly improve the performances of coherent X-ray microscopy.This perspective is of major interest for crystal microscopy,which aims at revealing the 3D crystalline structure of matter at the nanoscale,an approach strongly limited by the available coherent flux.Our results,based on Bragg ptychography experiments performed at the frst 4-generation synchrotron source,demonstrate the possibility of retrieving a high-quality image of the crystalline sample,with unprecedented quality.Importantly,the larger available coherent flux produces datasets with enough information to overcome experimental limitations,such as strongly deteriorated scanning conditions.We show this achievement would not be posible with 30-generation sources,a limit that has inhibited the development of this otherwise powerful microscopy method,so far.Hence,the advent of next-generation synchrotron sources not only makes Bragg ptychography suitable for high throughput studies but also strongly relaxes the associated experimental constraints,making it compatible with a wider range of experimental set-ups at the new synchrotrons.

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