Perovskite films for X-ray detection

作     者：Pei Yuan Lixiu Zhang Menghua Zhu Liming Ding Pei Yuan;Lixiu Zhang;Menghua Zhu;Liming Ding

作者机构：State Key Laboratory of Solidification ProcessingKey Laboratory of Radiation Detection Materials and DevicesSchool of Materials Science and EngineeringNorthwestern Polytechnical UniversityXi’an 710072China Center for Excellence in Nanoscience(CAS)Key Laboratory of Nanosystem and Hierarchical Fabrication(CAS)National Center for Nanoscience and TechnologyBeijing 100190China 

出 版 物：《Journal of Semiconductors》 (半导体学报（英文版）)

年 卷 期：2022年第43卷第7期

页      面：4-7页

核心收录：

学科分类：070207[理学-光学] 07[理学] 070205[理学-凝聚态物理] 0702[理学-物理学] 

基　　金：the National Natural Science Foundation of China (62104194) for financial support the National Key Research and Development Program of China (2017YFA0206600) the National Natural Science Foundation of China (51922032 and 21961160720) the open research fund of Songshan Lake Materials Laboratory (2021SLABF K02) for financial support。 

主　　题：PbI2 instance hinder 

摘      要：X-ray detection is widely used in research[1−3],product in-spection[4],nuclear station,and medical imaging.Si[5],α-Se[6],PbI2[7],and CdZnTe[8]are conventional semiconductors,and some problems limit their applications.For instance,Si andα-Se have low stopping power for X-ray[8],which hinders their application in high-energy range over 50 keV.Moreover,the complicated preparation,high operating voltage,and high fab-rication cost of these materials are the negative issues.