Optically pumped low-threshold microdisk lasers on a GeSn-on-insulator substrate with reduced defect density
Optically pumped low-threshold microdisk lasers on a GeSn-on-insulator substrate with reduced defect density作者机构:School of Electrical and Electronic EngineeringNanyang Technological UniversitySingapore 639798Singapore Department of Engineering PhysicsÉcole Polytechnique de MontréalMontréalQuébec H3C 3A7Canada
出 版 物:《Photonics Research》 (光子学研究(英文版))
年 卷 期:2022年第10卷第6期
页 面:1332-1337页
核心收录:
学科分类:080901[工学-物理电子学] 0809[工学-电子科学与技术(可授工学、理学学位)] 08[工学] 080401[工学-精密仪器及机械] 0804[工学-仪器科学与技术] 0803[工学-光学工程]
基 金:Mitacs,Innovation for Defence Excellence and Security,IDEaS,PRIMA Québec,Canada Foundation for Innovation,Canada Research Chairs,Natural Sciences and Engineering Research Council of Canada,iGrant of Singapore A*STAR(AME IRG(A2083c0053)) National Research Foundation Singapore(Competitive Research Program(NRF-CRP19-2017-01) NRF-ANR Joint Grant(NRF2018-NRF-ANR009 TIGER)) Ministry of Education-Singapore(Ac RF TIER 12019-T1-002-050(RG 148/19(S)) AcRF TIER 2(MOE2018-T2-2-011(S)) AcRF Tier 2(T2EP50121-0001(MOE-000180-01))
摘 要:Despite the recent success of GeSn infrared lasers,the high lasing threshold currently limits their integration into practical *** structural defects in epitaxial GeSn layers have been identified as one of the major bottlenecks towards low-threshold GeSn lasers,the effect of defects on the lasing threshold has not been well studied ***,we experimentally demonstrate that the reduced defect density in a GeSn-on-insulator substrate improves the lasing threshold *** first present a method of obtaining high-quality GeSn-oninsulator layers using low-temperature direct bonding and chemical–mechanical ***-temperature photoluminescence measurements reveal that the reduced defect density in GeSn-on-insulator leads to enhanced spontaneous emission and a reduced lasing threshold by0 times andtimes,*** result presents a new path towards pushing the performance of GeSn lasers to the limit.