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Terahertz near-field microscopy based on an air-plasma dynamic aperture

作     者:Xin-Ke Wang Jia-Sheng Ye Wen-Feng Sun Peng Han Lei Hou Yan Zhang Xin-ke Wang;Jia-sheng Ye;Wen-feng Sun;Peng Han;Lei Hou;Yan Zhang

作者机构:Beijing Key Laboratory of Metamaterials and DevicesKey Laboratory of Terahertz Optoelectronics Ministry of EducationDepartment of PhysicsCapital Normal UniversityBeijing 100048China Applied Physics DepartmentXian University of TechnologyXianShaanxi 710048China 

出 版 物:《Light(Science & Applications)》 (光(科学与应用)(英文版))

年 卷 期:2022年第11卷第6期

页      面:1149-1157页

核心收录:

学科分类:0808[工学-电气工程] 0809[工学-电子科学与技术(可授工学、理学学位)] 08[工学] 0805[工学-材料科学与工程(可授工学、理学学位)] 0803[工学-光学工程] 0702[理学-物理学] 

基  金:This work was supported by the National Natural Science Foundation of China(grant nos.11874132,1174243,11774246,and 12174271) the National Key R&D Program of China(No.2019YFC1711905) the Beijing Talents Project(grant no.2018A19) the Sino-German Mobility Program from Sino-German Center for Science Funding(Grant M-0225) DAAD/CSC Exchange Project,and Capacity Building for Science&Technology Innovation-Fundamental Scientifc Research Funds(grand no.00820531120017,00820530290072) 

主  题:field dynamic resolution 

摘      要:Terahertz(THz)near-field microscopy retains the advantages of THz radiation and realizes sub-wavelength imaging,which enables applications in fundamental research and industrial *** most THz near-field microscopies,the sample surface must be approached by a THz detector or source,which restricts the sample ***,a technique was developed based on an air-plasma dynamic aperture,where two mutually perpendicular air-plasmas overlapped to form a cross-filament above a sample surface that modulated an incident THz *** imaging with quasi sub-wavelength resolution(approximately λ/2,where λ is the wavelength of the THz beam)was thus observed without approaching the sample with any *** to the sample by the air-plasmas was ***-field imaging of four different materials was achieved,including metallic,semiconductor,plastic,and greasy *** resolution characteristics of the near-field system were investigated with experiment and *** advantages of the technique are expected to accelerate the advancement of THz microscopy.

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