High-resolution ARPES endstation for in situ electronic structure investigations at SSRF
High-resolution ARPES endstation for in situ electronic structure investigations at SSRF作者机构:State Key Laboratory of Functional Materials for InformaticsShanghai Institute of Microsystem and Information TechnologyChinese Academy of SciencesShanghai 200050China University of Chinese Academy of SciencesBeijing 100049China
出 版 物:《Nuclear Science and Techniques》 (核技术(英文))
年 卷 期:2021年第32卷第3期
页 面:94-106页
核心收录:
学科分类:07[理学] 070205[理学-凝聚态物理] 0807[工学-动力工程及工程热物理] 0827[工学-核科学与技术] 0703[理学-化学] 0702[理学-物理学] 0801[工学-力学(可授工学、理学学位)]
基 金:supported by the National Key R&D Program of the MOST of China(No.2016YFA0300204) the National Natural Science Foundation of China(No.11227902)as part of the SiP·ME2 beamline project
主 题:Synchrotron ARPES In situ VUV laser Quantum materials
摘 要:Angle-resolved photoemission spectroscopy(ARPES)is one of the most powerful experimental techniques in condensed matter *** ARPES,which uses photons with high flux and continuously tunable energy,has become particularly ***,an excellent synchrotron ARPES system must have features such as a small beam spot,super-high energy resolution,and a user-friendly operation interface.A synchrotron beamline and an endstation(BL03 U)were designed and constructed at the Shanghai Synchrotron Radiation *** beam spot size at the sample position is 7.5(V)μm×67(H)μm,and the fundamental photon range is 7-165 eV;the ARPES system enables photoemission with an energy resolution of 2.67 meV at21.2 *** addition,the ARPES system of this endstation is equipped with a six-axis cryogenic sample manipulator(the lowest temperature is 7 K)and is integrated with an oxide molecular beam epitaxy system and a scanning tunneling microscope,which can provide an advanced platform for in situ characterization of the fine electronic structure of condensed matter.