A dual-use probe for nano-metric photoelectric characterization using a confined light field generated by photonic crystals in the cantilever

作     者：Yaoping Hou Chengfu Ma Wenting Wang Yuhang Chen Yaoping Hou;Chengfu Ma;Wenting Wang;Yuhang Chen

作者机构：Department of Precision Machinery and Precision InstrumentationUniversity of Science and Technology of ChinaHefei230027China Key Laboratory of Precision Scientific Instrumentation of Anhui Higher Education InstitutesUniversity of Science and Technology of ChinaHefei230027China 

出 版 物：《Nano Research》 (纳米研究（英文版）)

年 卷 期：2021年第14卷第11期

页      面：3848-3853页

核心收录：

学科分类：07[理学] 070205[理学-凝聚态物理] 08[工学] 080501[工学-材料物理与化学] 0805[工学-材料科学与工程（可授工学、理学学位）] 0702[理学-物理学] 

基　　金：This work was supported by the National Natural Science Foundation of China(Nos.51675504 and 52075517) We acknowledge the USTC Center for Micro-and Nanoscale Research and Fabrication for technical support in the FIB processing 

主　　题：atomic force microscopy near-field scanning optical microscopy plasmonic probe photoelectric characterization surface plasmon polaritons 

摘      要：We propose a plasmonic atomic force microscopy (AFM) probe, which takes a part of the laser beam for monitoring cantilever deflection as the excitation light source. Photonic crystal cavities are integrated near the cantilever’s free end where the laser spot locates. The transmitted light excites surface plasmon polaritons on the metal-coated tip and induces a confined hot-spot at the tip apex. Numerical simulations demonstrate that the plasmonic probe can couple a tilted, linearly polarized beam efficiently and yield a remarkable local electromagnetic enhancement with the intensity being around 21 times stronger than that of the original probe. For demonstration, we employ the plasmonic probe in electrostatic force microscopy and scanning Kelvin probe microscopy to study the impact of local light field on the photoelectric characteristics of SiO_(2) and Au nanoparticles. Compared with the original probe, obvious differences are observed in the electrostatic force gradients on SiO_(2) nanoparticles and in the surface potentials of Au nanoparticles. The plasmonic probe can enable AFM as a powerful tool for simultaneous optical, mechanical and electrical characterizations.